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技術(shù)文章
nanonics技術(shù)突破
點(diǎn)擊次數(shù)：953 發(fā)布時(shí)間：2007/8/20 14:56:26
Nanonics presents a novel, patented planar, folded-piezo, flexure scanner design that allows simultaneous lateral and axial sample scanning as well as coarse inertial positioning. The ultra-thin package permits the scanner to be incorporated into systems where conventional scan stages would be too bulky. This unique device, developed for Nanonics" near-field scanning optical microscope, is now available as a stand alone addition for all scanning applications.
原創(chuàng)作者：瑞典凱戈納斯有限公司上海代表處
